Components of a Wafer Test Probe Station and the Importance and Requirements of Wafer Testing

The components of a wafer test probe table include a tester, a measuring and carrier table moving part, and a wafer handling part.wafer tester The tester assemb...

Nov 17,2023 | Ann

The components of a wafer test probe table include a tester, a measuring and carrier table moving part, and a wafer handling part. The tester assembly is used to transmit signals to test wafers, and the signals are transmitted via cables to the measurement and carrier table moving part, which controls the opening and closing of the wafer handle part. The wandering machinery is made of different components including a test probe head, a performance plate and a spring loaded contact pin for ensuring that the probe card is firmly in contact with the wafer. The wafers are vacuum-mounted on a wafer chuck, which in turn is mounted on a precision XY table that provides accurate motion.

Wafer testing is important because it can help improve semiconductor quality. During the R&D phase, especially when testing wafer prototypes, wafer testing enables manufacturers to assess the reliability of prototypes based on the analysis of potential defects. Therefore, wafer probes for R&D may need to have additional features such as temperature control capabilities to check the performance of prototypes in different environments, and the need to minimize electrical noise and signal leakage. Specialized testing may also require manual probe stations.

For volume production processes, wafer testing is often deployed to evaluate the electrical performance of individual IC chips. Wafer probes for such processes need to have automated handling and position control to make testing more efficient. In addition, the reliability and ease of maintenance of wafer probe stations are popular features in volume production testing. Manufacturers want to minimize equipment downtime.

measuring wafer prototypes wafer probe